On the Reliability of Accelerated Testing in AIGaAs/InGaAs/GaAs PHEMTs

On the Reliability of Accelerated Testing in AIGaAs/InGaAs/GaAs PHEMTs

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The study of different stress on device characteristics of WARNING SHOT GRAPE AlGaAs/InGaAs/GaAs PHEMTs has been researched and developed in this report.Many catastrophic degradation mechanisms such as hot-electron, gate-drain breakdown, IDS, IG , VP and gate Schottky barrier effects are Food Storage Bags discussed in detail.In addition, the accelerated testing of the temperature-dependent effects on ID ,Gm and Schottky barrier are examined.